New PDF release: Advanced scanning microscopy for nanotechnology techniques

By Weilie Zhou

ISBN-10: 0387333258

ISBN-13: 9780387333250

Show description

Read or Download Advanced scanning microscopy for nanotechnology techniques and applications PDF

Best nanotechnology books

Read e-book online Metal nanoparticles and their assemblies PDF

Steel nanoparticles of various sizes may be ready by means of actual in addition to chemical tools. They express many desirable houses, the size-dependent steel to nonmetal transition being an incredible one. steel nanoparticles capped through thiols will be equipped into ordered one-, - and 3-dimensional buildings and those buildings have capability purposes in nanodevices.

Baoshan Xing, Chad D. Vecitis, Nicola Senesi's Engineered Nanoparticles and the Environment: PDF

Info the resource, liberate, publicity, adsorption, aggregation, bioavailability, shipping, transformation, and modeling of engineered nanoparticles present in many universal items and applications
Covers synthesis, environmental program, detection, and characterization of engineered nanoparticles
Details the toxicity and possibility review of engineered nanoparticles
Includes themes at the shipping, transformation, and modeling of engineered nanoparticles
Presents the most recent advancements and information of engineered nanoparticles
Written by means of international major specialists from prestigious universities and firms

Extra resources for Advanced scanning microscopy for nanotechnology techniques and applications

Example text

For the situation illustrated in left side of Fig. 5, many of the emitted electrons are blocked by the surface island of the specimen and this results in a dark contrast in the image. In contrast, a bright contrast will occur if the emitted electrons are not blocked by the island (right side of Fig. 5). A bias can be applied on the detector so that the secondary electrons from the shadow side can reach the detector. Surface topography can also influence the emission efficiency of secondary electrons.

An intelligent switch box is placed between the EDX and the SEM and this arbitrates between the EDX and EBSD systems’ access to the SEM. In addition to beam control, for large sample area coverage, integrated stage motion is required. SEM motorized stages are often accessible 2. 9. Example EBSP from Quartz. 10. Schematic of SEM interface. through an RS232 serial computer interface or Ethernet connection, which can be addressed by the operating software. As the technique has developed in automated accuracy and overall speed, the ability to scan the beam over multiple points on the sample to create an OM has become practical, and is now the most common method for a microstructural investigation with EBSD.

By contrast, at a longer WD, corresponding to a narrow cone of electron beam results in an enhanced depth of field. However, a long WD does not mean a high resolution. Depth of field is important when we observe a specimen with large topographical variation. In this case, we prefer to use a long WD so that we can bring as much of the image into focus as possible. 18. SEM image of SnO2 nanojunctions showing depth of field. 1. 19. Beam diagram showing enhancement of depth of field (DF) by increasing working distance (WD).

Download PDF sample

Advanced scanning microscopy for nanotechnology techniques and applications by Weilie Zhou


by Michael
4.0

Rated 4.98 of 5 – based on 25 votes